Directory

Degang James Chen

  • Jerry R. Junkins Chair Professor

Main Office

2134 Coover
Ames, IA 50011-3060
Phone: 515-294-6277
Fax: 515-294-8432




Education

Ph.D., Electrical and Computer Engineering, University of California (1992)

M.S., Electrical and Computer Engineering, University of California (1988)

B.S., Tsinghua University, Beijing (1984)

Interest Areas

Core Research Areas: Systems and controls, VLSI, analog and mixed signal VLSI design and testing

Strategic Area: Materials, devices & circuits

Brief Biography

Dr. Chen was the John R. Pierce Instructor of electrical engineering with the California Institute of Technology, Pasadena, CA, USA, in 1992. Since then, he has been with Iowa State University, Ames, IA, USA, where he is currently a Professor and the Jerry Junkins Chair in the College of Engineering. He was a Faculty Fellow with Boeing, Chicago, IL, USA, in 1999, Maxim Integrated, San Jose, CA, USA, in 2001, and Texas Instruments (TI), Dallas, TX, USA, in 2011, 2012, and 2014. His current research interests include analog and mixed-signal integrated circuit design and testing, with particular emphasis on cost-effective strategies for enhancing performance and reliability while relaxing instrumentation

Selected Publications

  •  Duan, Yan, Hsinho Wu, Masashi Shimanouchi, Mike Peng Li, and Degang Chen. "A Low-Cost Comparator-Based Method for Accurate Decomposition of Deterministic Jitter in High-Speed Links." IEEE Transactions on Electromagnetic Compatibility (2018).
  • Liu, ZhiqiangShravan K. Chaganti, and Degang Chen. "Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit." IEEE Transactions on Circuits and Systems I: Regular Papers 65, no. 5 (2018): 1664-1674.
  • Zhuang, YumingBenjamin MagstadtTao Chen, and Degang Chen. "High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC–ADC Co-Testing." IEEE Transactions on Instrumentation and Measurement 67, no. 2 (2018): 279-287.
  • Duan, Yan, and Degang Chen. "Fast and Accurate Decomposition of Deterministic Jitter Components in High-Speed Links." IEEE Transactions on Electromagnetic Compatibility (2018).
  • Duan, YanTao Chen, and Degang Chen. "A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm." Journal of Electronic Testing (2017): 1-12.
  • Chen, Tao, Xiankun Jin, Randall L. Geiger, and Degang Chen. "USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test." IEEE Transactions on Circuits and Systems I: Regular Papers (2017).
  • Zhuang, Yuming, and Degang Chen. "Accurate Spectral Testing with Non-coherent Sampling for Multi-Tone Test." IEEE Transactions on Circuits and Systems II: Express Briefs (2017).
  • Li, YouZhiqiang Liu, and Degang Chen. "Efficient Verification Against Undesired Operating Points for MOS Analog Circuits." IEEE Transactions on Circuits and Systems I: Regular Papers64, no. 8 (2017): 2134-2145.
  • Zhuang, Yuming, and Degang Chen. "Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion." IEEE Transactions on Instrumentation and Measurement 66, no. 10 (2017): 2556-2565.
  • Zhuang, YumingLi Xu, and Degang Chen. "Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency." IEEE Transactions on Instrumentation and Measurement 66, no. 5 (2017): 1002-1012.
  • Zhuang, Yuming, and Degang Chen. "ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling." Journal of Electronic Testing 33, no. 3 (2017): 305-313.