Randall L Geiger
- Doluca Professor
Main Office2133 Coover
Ames, IA 50011-3060
Ph.D., Electrical Engineering, Colorado State University (1977)
M.S., Mathematics, University of Nebraska (1973)
B.S., Electrical Engineering, University of Nebraska (1972)
Core Research Areas: VLSI, secure and reliable computing, analog VLSI design, VLSI testing, high-speed data converters
Strategic Areas: Materials, devices, & circuits; cyber infrastructure
- Jin, L., D. Chen, and R. L. Geiger. SEIR Linearity Testing of Precision A/D Converters in Non-stationary Environments with Center-Symmetric Interleaving. IEEE Transactions on Instruction and Measurement, October 2007, 1776-1785. Jiang, H., B. Olleta, D. J. Chen, and R. L. Geiger. Testing High- Resolution ADCs with Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Transactions on Circuits and Systems I, May 2007, 964-973.
- Oletta, B., H. Jiang, D. J. Chen, and R. L. Geiger. A Deterministic Dyanmic Element Mating Approach for Testing High-Resolution ADCs with Low Accuracy Excitations. IEEE Transactions on Instruction and Measurement 55, no. 3, (June 2006): 902-915.
- Lin, Y., D. Chen, and R. L. Geiger. Yield Enhancement with Optimal Area Allocation for Radio-Critical Analog Circuits. IEEE Transactions on Circuits and Systems 53, (March 2006): 534-553. Cong and R. L. Geiger. A 1.5v 14-bit 100-MS/s Self-Calibrated DAC. IEEE Journal of Solid State Circuits 38, no. 12, (December 2003): 2051-2060.