2134 Coover Ames, IA 50011-3060 Phone: 515-294-6277 Fax: 515-294-8432
PhD, Electrical and Computer Engineering, University of California, Santa Barbara (1992)
MS, Electrical and Computer Engineering, University of California, Santa Barbara (1988)
BS, Tsinghua University, Beijing (1984)
Analog and mixed signal VLSI design and testing
Core Research Areas: VLSI; systems and controls
Strategic Research Area: Small-Scale Technology
Xing, Hanqing, Hanjun Jiang, Degang Chen, and Randall Geiger. High-resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrumentation and Measurement 58, no. 8, (August 2009): 2697-2705.
He, Jun, Sanyi Zhan, Degang Chen, and Randall Geiger. Analyses of Static and Dynamic Offset Voltage in Dynamic Comparators. IEEE Trans. Circuits and Systems I: Fundamental Theory and Applications 56, no. 5, (May 2009): 911-919.
Jiang, H., B. Olleta, D. Chen, and R. L. Geiger. Testing High-Resolution ADCs with Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Transactions on Instrumentation and Measurement 56, no. 5, (October 2007): 1753-1762.
He, C., L. Jin, D. Chen, and R. L. Geiger. Robust High-Gain Amplifier Design Using Dynamic Systems and Bifurcation Theory with Digital Post-Processing Techniques. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 54, no. 5, (May 2007): 964-973.
He, C., X. Dai, H. Xing, and D. Chen. New Layout Strategies with Improved Matching Performance. Analog Integrated Circuits and Signal Processing 49, no. 3, (December 2006): 281-289.