Randall Geiger

Tunc and Lale Doluca Professor in Electrical and Computer Engineering

2133 Coover
2520 Osborn Dr.
Ames, IA 500111046

Ph.D., Electrical Engineering, Colorado State University (1977)

M.S., Mathematics, University of Nebraska (1973)

B.S., Electrical Engineering, University of Nebraska (1972)

Core Area(s): VLSI, secure and reliable computing, analog VLSI design, VLSI testing, high-speed data converters

Department’s Strategic Area(s): Materials, devices, & circuits; cyber infrastructure

Google Scholar Profile: https://scholar.google.com/citations?user=f-GCFyQAAAAJ&hl=en

Jin, L., D. Chen, and R. L. Geiger. SEIR Linearity Testing of Precision A/D Converters in Non-stationary Environments with Center-Symmetric Interleaving. IEEE Transactions on Instruction and Measurement, October 2007, 1776-1785. Jiang, H., B. Olleta, D. J. Chen, and R. L. Geiger. Testing High- Resolution ADCs with Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Transactions on Circuits and Systems I, May 2007, 964-973.
Oletta, B., H. Jiang, D. J. Chen, and R. L. Geiger. A Deterministic Dyanmic Element Mating Approach for Testing High-Resolution ADCs with Low Accuracy Excitations. IEEE Transactions on Instruction and Measurement 55, no. 3, (June 2006): 902-915.
Lin, Y., D. Chen, and R. L. Geiger. Yield Enhancement with Optimal Area Allocation for Radio-Critical Analog Circuits. IEEE Transactions on Circuits and Systems 53, (March 2006): 534-553.
Cong and R. L. Geiger. A 1.5v 14-bit 100-MS/s Self-Calibrated DAC. IEEE Journal of Solid State Circuits 38, no. 12, (December 2003): 2051-2060.